Title :
Methodology of detection of spurious signals in VLSI circuits
Author :
Moll, Francesc ; Rubio, Antonio
Author_Institution :
Dept. of Electron. Eng., Univ. Politecnica de Catalunya, Barcelona, Spain
Abstract :
The continuous reduction in scale achieved in microelectronic technology and the increasing switching speed may cause parasitic or spurious signals to appear, due to crosstalk. In this work, scale reduction of interconnections is analyzed, showing the increasing mutual capacitance and a model of crosstalk considering parasitic capacitive coupling is shown. A method for studying the propagation of crosstalk signals has been developed for combinational circuits. An algorithm for crosstalk faults test pattern generation is proposed taking into account the propagation limitation of the signals. Experimental results are shown
Keywords :
VLSI; combinatorial circuits; crosstalk; fault location; integrated circuit testing; integrated logic circuits; logic testing; signal detection; MEDICI; VLSI circuits; capacitive coupling; combinational circuits; crosstalk; interconnections; mutual capacitance; parasitic signals; scale reduction; spurious signals; Circuit faults; Combinational circuits; Coupling circuits; Crosstalk; Integrated circuit interconnections; Microelectronics; Mutual coupling; Parasitic capacitance; Signal detection; Very large scale integration;
Conference_Titel :
European Test Conference, 1993. Proceedings of ETC 93., Third
Conference_Location :
Rotterdam
Print_ISBN :
0-8186-3360-3
DOI :
10.1109/ETC.1993.246601
