Title :
Characterization of electromagnetic leakages throughout the connector shell
Author :
Bouri, Y. ; Koné, L. ; Razafiarivelo, J. ; Baudry, D. ; Baranowski, S. ; Démoulin, B.
Author_Institution :
Corp. Res. Center, FCI, Epernon
Abstract :
The paper deals with methodology to analyze electromagnetic (EM) leakages from connectors shielding due to the presence of apertures and slots. Some experimental and numerical results will be proposed to evaluate the electromagnetic coupling between connector apertures and a PCB trace line in terms of current and voltage induced on the line.
Keywords :
electric connectors; electromagnetic coupling; electromagnetic shielding; printed circuits; PCB trace line; connector shell; electromagnetic coupling; electromagnetic leakage; electromagnetic shielding; Connectors;
Conference_Titel :
Signal Propagation on Interconnects, 2007. SPI 2007. IEEE Workshop on
Conference_Location :
Genova
Print_ISBN :
978-1-4244-1223-5
Electronic_ISBN :
978-1-4244-1224-2
DOI :
10.1109/SPI.2007.4512224
