• DocumentCode
    3378835
  • Title

    Considerations on impedance matrix determination for accurate passive device characterization

  • Author

    Wojnowski, M. ; Engl, M. ; Weigel, R.

  • Author_Institution
    Infineon Technol. AG, Neubiberg
  • fYear
    2007
  • fDate
    13-16 May 2007
  • Firstpage
    117
  • Lastpage
    120
  • Abstract
    For accurate RLCG-parameter extraction the measured S-parameter matrix needs to be converted to the Z-matrix. However, there exist three different definitions of S-parameters and consequently three different formulas of converting S-matrix into Z-matrix. In this article, we present an overview of existing S-parameters definitions and examine the uncertainties associated with the S-matrix to Z-matrix transformations. Further, we introduce an error estimator describing the inaccuracy one makes performing the incorrect transformation. We compare de-embedded measurement results of an inductor manufactured in Si-based MCM-D technology. We show that using wrong transformation can easily lead to erroneous or even catastrophic results.
  • Keywords
    S-parameters; impedance matrix; network analysers; RLCG-parameter extraction; S-parameter matrix; Si-based MCM-D technology; Z-matrix; impedance matrix determination; passive device characterization; Calibration; Circuit simulation; Impedance measurement; Inductors; Matrix converters; Scattering parameters; Transmission line matrix methods; Transmission line measurements; Voltage; Waveguide theory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Signal Propagation on Interconnects, 2007. SPI 2007. IEEE Workshop on
  • Conference_Location
    Genova
  • Print_ISBN
    978-1-4244-1223-5
  • Electronic_ISBN
    978-1-4244-1224-2
  • Type

    conf

  • DOI
    10.1109/SPI.2007.4512226
  • Filename
    4512226