Title :
The structure of complete test sets for programmable logic arrays
Author :
Goldberg, Eugene I. ; Novikov, Yakov A.
Author_Institution :
Inst. of Eng. Cybern., Acad. of Sci., Minsk, Byelorussia
Abstract :
A new approach to complete testing of a PLA without any auxiliary facilities is presented. PLA testability is provided by the exact minimization of the PLA in the number of product lines. A theorem about the structure of a complete test set detecting all testable single and multiple crosspoint faults in such a minimal PLA is presented. It formulates the three conditions to which the complete test set satisfies. A technique for constructing complete test sets is discussed
Keywords :
VLSI; fault location; integrated logic circuits; logic arrays; logic testing; minimisation; PLA testability; minimization; multiple crosspoint faults; programmable logic arrays; single faults; Cybernetics; Decoding; Degradation; Fault detection; Logic design; Logic testing; Programmable logic arrays; Very large scale integration;
Conference_Titel :
European Test Conference, 1993. Proceedings of ETC 93., Third
Conference_Location :
Rotterdam
Print_ISBN :
0-8186-3360-3
DOI :
10.1109/ETC.1993.246607
