Title :
Automated comparison of measured versus expected signals in mixed signal device testing and its effect on fault localization strategies
Author :
Helmreich, Klaus ; Chowanetz, Michael ; Wolz, Werner ; Scharf, Ronald ; Müller-Glaser, Klaus D.
Author_Institution :
Inst. of Comput., Aided Circuit Design, Erlangen Univ., Germany
Abstract :
The comparison of measured versus expected signals is the basic operation of any test process. It becomes a critical task especially when rather noisy contactless measurement techniques are employed for prototype debug and quality assurance purposes. The presentation describes ways of get most reasonable pass/fail decisions in the case of uncertainties
Keywords :
automatic testing; electron device testing; fault location; mixed analogue-digital integrated circuits; production testing; quality control; fault localization strategies; mixed signal device testing; noisy contactless measurement; pass/fail decisions; prototype debug; quality assurance; Automatic testing; Circuit faults; Circuit testing; Distortion measurement; Error correction; Integrated circuit measurements; Prototypes; Quality assurance; Semiconductor device measurement; Signal processing;
Conference_Titel :
European Test Conference, 1993. Proceedings of ETC 93., Third
Conference_Location :
Rotterdam
Print_ISBN :
0-8186-3360-3
DOI :
10.1109/ETC.1993.246611
