Functional level testability analysis for digital circuits

Author

Ubar, Raimund ; Kuchcinski, Krzysztof

Author_Institution

Tallinn Tech. Univ., Estonia

fYear

1993

fDate

19-22 Apr 1993

Firstpage

545

Lastpage

546

Abstract

A general approach is proposed for calculating controllabilities and observabilities of signals in sequential and combinational circuits at the functional level. The methods and algorithms are based on alternative graphs which are an extension of binary decision diagrams. The algorithms are general and can be easily adjusted for calculation of different testability measures. A structured expression of the combinational controllability is presented, which allows to regard initiability and different heuristic controllability measures as components of the probabilistic controllability

Keywords

combinatorial circuits; controllability; design for testability; logic testing; observability; probability; sequential circuits; binary decision diagrams; combinational circuits; functional level; heuristic controllability; logic testing; observabilities; probabilistic controllability; sequential circuits; Boolean functions; Circuit analysis; Circuit testing; Combinational circuits; Data structures; Digital circuits; Observability; Sequential analysis; Sequential circuits; Signal analysis;

fLanguage

English

Publisher

ieee

Conference_Titel

European Test Conference, 1993. Proceedings of ETC 93., Third

Conference_Location

Rotterdam

Print_ISBN

0-8186-3360-3

Type

conf

DOI

10.1109/ETC.1993.246623

Filename

246623