DocumentCode :
3379165
Title :
Application of measured twinax cable S-parameters for transient circuit simulations
Author :
Chen, Zhaoqing
Author_Institution :
IBM Corp., Poughkeepsie, NY
fYear :
2007
fDate :
13-16 May 2007
Firstpage :
179
Lastpage :
181
Abstract :
Practical methods of making use of measured twinax cable S-parameters for transient circuit simulations are discussed and compared. Due to extremely long delay of the cable, most available tools fail or give inaccurate simulation results if we use the measured S-Parameters directly. Careful verification is absolutely necessary for any tool. For complex tasks like the worst-case eye diagram with nonlinear I/O devices, we still need more accurate and faster methodologies. This long delay case has been accepted as a very good benchmark for testing S-parameter based SPICE modeling tools and the transient simulation tools implemented with the S-parameter convolution method.
Keywords :
S-parameters; SPICE; cables (electric); circuit simulation; S-parameter convolution method; SPICE modeling tools; nonlinear I/O devices; transient circuit simulations; twinax cable S-Parameters; Benchmark testing; Circuit simulation; Circuit testing; Convolution; Crosstalk; Delay; Packaging; SPICE; Scattering parameters; Signal analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Signal Propagation on Interconnects, 2007. SPI 2007. IEEE Workshop on
Conference_Location :
Genova
Print_ISBN :
978-1-4244-1223-5
Electronic_ISBN :
978-1-4244-1224-2
Type :
conf
DOI :
10.1109/SPI.2007.4512244
Filename :
4512244
Link To Document :
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