DocumentCode
3379251
Title
Performance evaluation of low-dimensional sifts
Author
Duanduan, Yang ; Sluzek, Andrzej
Author_Institution
Sch. of Comput. Eng., Nanyang Technol. Univ., Singapore, Singapore
fYear
2010
fDate
26-29 Sept. 2010
Firstpage
2729
Lastpage
2732
Abstract
The scale-invariant feature transform (SIFT) descriptor has been widely applied in many fields due to its resistance to common image transformations. However, the dimension of SIFT is high which makes it not practical in limited-memory systems. Thus, some lower-dimension SIFTs are proposed by using subspace projection techniques. The most popular technique is Principle Component Analysis (PCA) which can produce two different lower-dimension SIFTs, PCA-SIFT and PSIFT. They apply PCA on gradient field of local patches or on a set of training descriptors, respectively. However, the other subspace techniques can be also used. This paper proposes two more low-dimensional SIFTs (namely LPP-SIFT and SPCA-SIFT) by incorporating manifold subspace and sparse eigenspace learning techniques (Locality Preserving Projection and Sparse PCA are used as the exemplary implementations). Although these techniques are not novel, our results demonstrate they can be used to produce low-dimensional SIFTs. More importantly, by comparing their performance to the existing low-dimension SIFTs, we show which of them are more suitable for image matching.
Keywords
eigenvalues and eigenfunctions; feature extraction; gradient methods; image processing; performance evaluation; principal component analysis; transforms; PCA; gradient field; image transformation; low-dimensional SIFT; performance evaluation; principle component analysis; scale-invariant feature transform descriptor; sparse eigenspace learning technique; subspace projection technique; Image coding; Lighting; Manifolds; Principal component analysis; Symmetric matrices; Training; Transform coding; SIFT; local features; subspace learning;
fLanguage
English
Publisher
ieee
Conference_Titel
Image Processing (ICIP), 2010 17th IEEE International Conference on
Conference_Location
Hong Kong
ISSN
1522-4880
Print_ISBN
978-1-4244-7992-4
Electronic_ISBN
1522-4880
Type
conf
DOI
10.1109/ICIP.2010.5654295
Filename
5654295
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