Title :
More on noncommutative polynomial identity testing
Author :
Bogdanov, Andrej ; Wee, Hoeteck
Author_Institution :
Comput. Sci. Div., California Univ., Berkeley, CA, USA
Abstract :
We continue the study of noncommutative polynomial identity testing initiated by Raz and Shpilka and present efficient algorithms for the following problems in the noncommutative model: polynomial identity testing: The algorithm gets as an input an arithmetic circuit with the promise that the polynomial it computes has small degree (for instance, a circuit of logarithmic depth or an arithmetic formula) and determines whether or not the output of the circuit is identically zero (as a formal expression). Unlike the algorithm by Raz and Shpilka, our algorithm is black-box (but randomized with one-sided error) and evaluates the circuit over the ring of matrices. In addition, we present query complexity lower bounds for identity testing and explore the possibility of de-randomizing our algorithm. The analysis of our algorithm uses a noncommutative variant of the Schwartz-Zippel test. Minimizing algebraic branching programs: The algorithm gets as an input an algebraic branching program (ABP) and outputs a smallest equivalent ABP. The algorithm is based on Nisan´s characterization of ABP complexity, and uses as a sub-routine an algorithm for computing linear dependencies amongst arithmetic formulas, a problem previously studied by the authors.
Keywords :
circuit complexity; circuit testing; digital arithmetic; matrix algebra; polynomials; randomised algorithms; ABP complexity; Schwartz-Zippel test; algebraic branching program; algorithm derandomizing; arithmetic circuit; arithmetic formula; black-box algorithm; linear dependency; logarithmic depth; matrix algebra; noncommutative polynomial identity testing; query complexity lower bound; randomized algorithm; Algorithm design and analysis; Binary decision diagrams; Circuit testing; Computer science; Digital arithmetic; Galois fields; Polynomials;
Conference_Titel :
Computational Complexity, 2005. Proceedings. Twentieth Annual IEEE Conference on
Print_ISBN :
0-7695-2364-1
DOI :
10.1109/CCC.2005.13