DocumentCode
3379541
Title
ADDLL/VDD-biasing co-design for process characterization, performance calibration, and clock synchronization in variation-tolerant designs
Author
Wang, Linn-Shyan ; Chien, Yung-Chen ; Lin, Lia-Hong ; Cheng, Chun-Yuan ; Ma, Ying-Ting ; Huang, Chung-Hsun
Author_Institution
Dept. of Electr. Eng., Chung-Cheng Univ., Chiayi, Taiwan
fYear
2011
fDate
25-28 Oct. 2011
Firstpage
47
Lastpage
50
Abstract
This work proposes an ADDLL/VDD-biasing co-design methodology for variation-tolerant designs. A modified ADDLL behaves as a variability sensor in the beginning of operation, and the sensing result is used by a VDD-biasing circuit to adjust the VDD of a loaded design for performance calibration. During normal operation, the ADDLL is reused as a de-skewing element for the calibrated design. With this methodology, not only the performance of the loaded design but also that of the ADDLL can be effectively adjusted toward their design specifications even under serious process variations.
Keywords
CMOS digital integrated circuits; calibration; integrated circuit design; synchronisation; system-on-chip; ADDLL-VDD-biasing codesign methodology; SoC; calibrated design; clock synchronization; de-skewing element; loaded design; nanometer CMOS technologies; performance calibration; process characterization; variability sensor; variation-tolerant designs; CMOS integrated circuits; CMOS technology; Calibration; Clocks;
fLanguage
English
Publisher
ieee
Conference_Titel
ASIC (ASICON), 2011 IEEE 9th International Conference on
Conference_Location
Xiamen
ISSN
2162-7541
Print_ISBN
978-1-61284-192-2
Electronic_ISBN
2162-7541
Type
conf
DOI
10.1109/ASICON.2011.6157119
Filename
6157119
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