• DocumentCode
    3379541
  • Title

    ADDLL/VDD-biasing co-design for process characterization, performance calibration, and clock synchronization in variation-tolerant designs

  • Author

    Wang, Linn-Shyan ; Chien, Yung-Chen ; Lin, Lia-Hong ; Cheng, Chun-Yuan ; Ma, Ying-Ting ; Huang, Chung-Hsun

  • Author_Institution
    Dept. of Electr. Eng., Chung-Cheng Univ., Chiayi, Taiwan
  • fYear
    2011
  • fDate
    25-28 Oct. 2011
  • Firstpage
    47
  • Lastpage
    50
  • Abstract
    This work proposes an ADDLL/VDD-biasing co-design methodology for variation-tolerant designs. A modified ADDLL behaves as a variability sensor in the beginning of operation, and the sensing result is used by a VDD-biasing circuit to adjust the VDD of a loaded design for performance calibration. During normal operation, the ADDLL is reused as a de-skewing element for the calibrated design. With this methodology, not only the performance of the loaded design but also that of the ADDLL can be effectively adjusted toward their design specifications even under serious process variations.
  • Keywords
    CMOS digital integrated circuits; calibration; integrated circuit design; synchronisation; system-on-chip; ADDLL-VDD-biasing codesign methodology; SoC; calibrated design; clock synchronization; de-skewing element; loaded design; nanometer CMOS technologies; performance calibration; process characterization; variability sensor; variation-tolerant designs; CMOS integrated circuits; CMOS technology; Calibration; Clocks;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ASIC (ASICON), 2011 IEEE 9th International Conference on
  • Conference_Location
    Xiamen
  • ISSN
    2162-7541
  • Print_ISBN
    978-1-61284-192-2
  • Electronic_ISBN
    2162-7541
  • Type

    conf

  • DOI
    10.1109/ASICON.2011.6157119
  • Filename
    6157119