• DocumentCode
    3379543
  • Title

    Characterization of 19.9%-efficient CIGS absorbers

  • Author

    Repins, Ingrid ; Contreras, Miguel ; Romero, Manuel ; Yan, Yanfa ; Metzger, Wyatt ; Li, Jian ; Johnston, Steve ; Egaas, Brian ; DeHart, Clay ; Scharf, John ; McCandless, Brian E. ; Noufi, Rommel

  • Author_Institution
    National Renewable Energy Laboratory, Golden, CO 80401, USA
  • fYear
    2008
  • fDate
    11-16 May 2008
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    We recently reported a new record total-area efficiency, 19.9%, for CuInGaSe2 (CIGS)-based thin-film solar cells [1]. Current-voltage analysis indicates that improved performance in the record device is due to reduced recombination. The reduced recombination was achieved by terminating the processing with a Ga-poor (In-rich) layer, which has led to a number of devices exceeding the prior (19.5%) efficiency record. This paper documents the properties of the high-efficiency CIGS by a variety of characterization techniques, with an emphasis on identifying near-surface properties associated with the modified processing.
  • Keywords
    Energy conversion; Grain boundaries; Laboratories; Luminescence; Probes; Renewable energy resources; Scanning electron microscopy; Spectroscopy; Transmission electron microscopy; Tunneling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2008. PVSC '08. 33rd IEEE
  • Conference_Location
    San Diego, CA, USA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-1640-0
  • Electronic_ISBN
    0160-8371
  • Type

    conf

  • DOI
    10.1109/PVSC.2008.4922628
  • Filename
    4922628