DocumentCode
3379606
Title
THz Bipolar Transistor Circuits: Technical Feasibility, Technology Development, Integrated Circuit Results
Author
Rodwell, Mark ; Lobisser, E. ; Wistey, M. ; Jain, V. ; Baraskar, A. ; Lind, E. ; Koo, J. ; Griffith, Z. ; Hacker, J. ; Urteaga, M. ; Mensa, D. ; Pierson, Richard ; Brar, B.
Author_Institution
California Univ., Santa Barbara, CA
fYear
2008
fDate
12-15 Oct. 2008
Firstpage
1
Lastpage
3
Abstract
We examine the feasibility of developing bipolar transistors with current-gain and power-gain cutoff frequencies of 1-3 THz. High bandwidths are obtained by scaling; the critical limits to such scaling are the requirements that the current density increase in proportion to the square of bandwidth and that the metal-semiconductor contact resistivities vary as the inverse square of device bandwidth. Transistors with 755 GHz fmax and 324 GHz amplifiers have been demonstrated. Contacts with resistivity sufficient for the 64 nm scaling generation (1 THz ftau2 THz fmax) have been developed.
Keywords
amplifiers; bipolar transistor circuits; contact resistance; submillimetre wave integrated circuits; THz bipolar transistor circuits; amplifiers; current density; current-gain cutoff frequencies; frequency 1 THz to 3 THz; metal-semiconductor contact resistivities; power-gain cutoff frequencies; technical feasibility; technology development; Bandwidth; Bipolar integrated circuits; Bipolar transistor circuits; Bipolar transistors; Capacitance; Conductivity; Current density; Integrated circuit technology; Ohmic contacts; Thermal resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Compound Semiconductor Integrated Circuits Symposium, 2008. CSIC '08. IEEE
Conference_Location
Monterey, CA
ISSN
1550-8781
Print_ISBN
978-1-4244-1939-5
Electronic_ISBN
1550-8781
Type
conf
DOI
10.1109/CSICS.2008.5
Filename
4674460
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