• DocumentCode
    3379606
  • Title

    THz Bipolar Transistor Circuits: Technical Feasibility, Technology Development, Integrated Circuit Results

  • Author

    Rodwell, Mark ; Lobisser, E. ; Wistey, M. ; Jain, V. ; Baraskar, A. ; Lind, E. ; Koo, J. ; Griffith, Z. ; Hacker, J. ; Urteaga, M. ; Mensa, D. ; Pierson, Richard ; Brar, B.

  • Author_Institution
    California Univ., Santa Barbara, CA
  • fYear
    2008
  • fDate
    12-15 Oct. 2008
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    We examine the feasibility of developing bipolar transistors with current-gain and power-gain cutoff frequencies of 1-3 THz. High bandwidths are obtained by scaling; the critical limits to such scaling are the requirements that the current density increase in proportion to the square of bandwidth and that the metal-semiconductor contact resistivities vary as the inverse square of device bandwidth. Transistors with 755 GHz fmax and 324 GHz amplifiers have been demonstrated. Contacts with resistivity sufficient for the 64 nm scaling generation (1 THz ftau2 THz fmax) have been developed.
  • Keywords
    amplifiers; bipolar transistor circuits; contact resistance; submillimetre wave integrated circuits; THz bipolar transistor circuits; amplifiers; current density; current-gain cutoff frequencies; frequency 1 THz to 3 THz; metal-semiconductor contact resistivities; power-gain cutoff frequencies; technical feasibility; technology development; Bandwidth; Bipolar integrated circuits; Bipolar transistor circuits; Bipolar transistors; Capacitance; Conductivity; Current density; Integrated circuit technology; Ohmic contacts; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Compound Semiconductor Integrated Circuits Symposium, 2008. CSIC '08. IEEE
  • Conference_Location
    Monterey, CA
  • ISSN
    1550-8781
  • Print_ISBN
    978-1-4244-1939-5
  • Electronic_ISBN
    1550-8781
  • Type

    conf

  • DOI
    10.1109/CSICS.2008.5
  • Filename
    4674460