DocumentCode
3379621
Title
Multi-chains encoding scheme in low-cost ATE
Author
Chen, Gong-Han ; Wu, Po-Han ; Rau, Jiann-Chyi
Author_Institution
Dept. of Electr. Eng., Tamkang Univ., Tamsui, Taiwan
fYear
2010
fDate
May 30 2010-June 2 2010
Firstpage
1587
Lastpage
1590
Abstract
Generally speaking, the dependency data compression is very useful for Intellectual Property (IP) cores and SoC. We consider the shift-in power and compression ratio in low-cost ATE environment. We propose new compression architecture with fixed length for running ones. We suppose that the ATE has not repeated function and synchronization signal. In the results, when the complexity of VLSI circuit is growing up, the number of input pins for testing is very low. The average compression ratio of our method is 63% for MinTest on ISCAS´89 benchmarks. The average of peak/WTC shift-in turns to 3×/6.6×, after comparing Selective Scan Slice (SSS) and our method. The average of hardware overhead is 6%.
Keywords
VLSI; automatic test equipment; circuit complexity; data compression; encoding; industrial property; integrated circuit testing; system-on-chip; ISCAS´89 benchmark mintest; SoC; VLSI circuit complexity; automatic test equipment; average compression ratio; compression architecture; intellectual property core; low-cost ATE; multichain encoding scheme; selective scan slice; Circuit testing; Data compression; Encoding; Energy consumption; Filling; Frequency synchronization; Hardware; Logic; Power dissipation; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems (ISCAS), Proceedings of 2010 IEEE International Symposium on
Conference_Location
Paris
Print_ISBN
978-1-4244-5308-5
Electronic_ISBN
978-1-4244-5309-2
Type
conf
DOI
10.1109/ISCAS.2010.5537430
Filename
5537430
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