• DocumentCode
    3379621
  • Title

    Multi-chains encoding scheme in low-cost ATE

  • Author

    Chen, Gong-Han ; Wu, Po-Han ; Rau, Jiann-Chyi

  • Author_Institution
    Dept. of Electr. Eng., Tamkang Univ., Tamsui, Taiwan
  • fYear
    2010
  • fDate
    May 30 2010-June 2 2010
  • Firstpage
    1587
  • Lastpage
    1590
  • Abstract
    Generally speaking, the dependency data compression is very useful for Intellectual Property (IP) cores and SoC. We consider the shift-in power and compression ratio in low-cost ATE environment. We propose new compression architecture with fixed length for running ones. We suppose that the ATE has not repeated function and synchronization signal. In the results, when the complexity of VLSI circuit is growing up, the number of input pins for testing is very low. The average compression ratio of our method is 63% for MinTest on ISCAS´89 benchmarks. The average of peak/WTC shift-in turns to 3×/6.6×, after comparing Selective Scan Slice (SSS) and our method. The average of hardware overhead is 6%.
  • Keywords
    VLSI; automatic test equipment; circuit complexity; data compression; encoding; industrial property; integrated circuit testing; system-on-chip; ISCAS´89 benchmark mintest; SoC; VLSI circuit complexity; automatic test equipment; average compression ratio; compression architecture; intellectual property core; low-cost ATE; multichain encoding scheme; selective scan slice; Circuit testing; Data compression; Encoding; Energy consumption; Filling; Frequency synchronization; Hardware; Logic; Power dissipation; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (ISCAS), Proceedings of 2010 IEEE International Symposium on
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4244-5308-5
  • Electronic_ISBN
    978-1-4244-5309-2
  • Type

    conf

  • DOI
    10.1109/ISCAS.2010.5537430
  • Filename
    5537430