• DocumentCode
    3379715
  • Title

    A resistor-less overload detector for dc/dc linear regulators

  • Author

    De Lima, Jader A. ; Pimenta, Wallace A.

  • Author_Institution
    Center of Technol. for Inf. (CTI), Campinas, Brazil
  • fYear
    2010
  • fDate
    May 30 2010-June 2 2010
  • Firstpage
    837
  • Lastpage
    840
  • Abstract
    A compact resistor-less current detector that protects linear regulators against overcurrent is proposed. The circuit suits converters with either p- or n-channel pass-device, for different dropout voltages. The ratio between detection threshold ITH and a reference current IREF depends only on transistor geometry scaling, making the detector robust to process and temperature (PT) spread. As part of a 50 mA-linear regulator, the detector was designed and simulated according to a high-voltage 0.35 μm CMOS process. For a nominal value of 75mA, ITH data are [79.3mA@-40°C, 81.9mA@150°C] and [84.1mA@-40°C, 85.8mA @150°C] for p- and n-MOSFET regulators, respectively, already including the hysteresis effect in the arbitration-circuit input. The converter total quiescent consumption is below 220 μA. Overload condition is flagged within 32 ns, typically. Additionally, the detector shows low susceptibility to a noisy power input voltage.
  • Keywords
    CMOS integrated circuits; DC-DC power convertors; MOSFET; detector circuits; overcurrent protection; voltage regulators; DC-DC linear regulators; compact resistor-less current detector; converter total quiescent consumption; current 50 mA; detection threshold ratio; dropout voltage regulator; high-voltage CMOS process; hysteresis effect; n-MOSFET regulators; n-channel pass-device; overcurrent protection; p-MOSFET regulators; p-channel pass-device; reference current; size 0.35 mum; time 32 ns; transistor geometry scaling; CMOS process; Detectors; Geometry; Hysteresis; MOSFET circuits; Protection; Regulators; Robustness; Temperature dependence; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (ISCAS), Proceedings of 2010 IEEE International Symposium on
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4244-5308-5
  • Electronic_ISBN
    978-1-4244-5309-2
  • Type

    conf

  • DOI
    10.1109/ISCAS.2010.5537435
  • Filename
    5537435