Title :
The DARPA FLARE Program: Recent Advances in Ultra High Linearity RF Amplifiers
Author :
Raman, Sanjay ; Chang, Tsu-Hsi ; Eden, Richard C. ; Pappert, Steve
Author_Institution :
Defense Adv. Res. Projects Agency, Arlington, VA
Abstract :
The DARPA Feedback Linearized Amplifier for RF Electronics (FLARE) Program has demonstrated the world´s first microwave operational amplifier with record linearity through the use of strong negative feedback made possible by the large available gain-bandwidth product in state-of-the-art Indium Phosphide (InP) transistor technologies. The output third-order intercept point (OIP3) near 2 GHz is measured to be +51.4 dBm while consuming only 899 mW of power (PDc), leading to a record Linearity Figure of Merit (OIP3/PDC) of 154 which is roughly 5X higher than that of any RF amplifiers in use at these frequencies today. This amplifier design is enabled by 400 GHz InP Hetero- junction Bipolar Transistor (HBT) technology with multi-level interconnect technology and novel feedback circuit design to efficiently eliminate the nonlinearity while maintaining loop stability at high frequency. This successful demonstration shows a clear path toward power-efficient low-noise ultra-high-linearity (OIP3 > +60 dBm) RF amplifiers for future military systems.
Keywords :
heterojunction bipolar transistors; high electron mobility transistors; microwave amplifiers; operational amplifiers; DARPA FLARE program; Feedback Linearized Amplifier for RF Electronics Program; HEMT; RF amplifiers; heterojunction bipolar transistor; microwave operational amplifier; multi-level interconnect technology; negative feedback; output third-order intercept point; Indium phosphide; Linearity; Microwave amplifiers; Microwave technology; Microwave transistors; Negative feedback; Operational amplifiers; Radio frequency; Radiofrequency amplifiers; State feedback;
Conference_Titel :
Compound Semiconductor Integrated Circuits Symposium, 2008. CSIC '08. IEEE
Conference_Location :
Monterey, CA
Print_ISBN :
978-1-4244-1939-5
Electronic_ISBN :
1550-8781
DOI :
10.1109/CSICS.2008.10