• DocumentCode
    3379784
  • Title

    A new surface passivation technique for crystalline Si solar cells: Valence-mending passivation

  • Author

    Tao, M.

  • Author_Institution
    Department of Electrical Engineering, University of Texas at Arlington, 76019, USA
  • fYear
    2008
  • fDate
    11-16 May 2008
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    A valence-mended semiconductor surface is free of dangling bonds and free of surface states. Such a surface is accomplished by depositing a single atomic layer of valence-mending atoms on the surface. For the Si(100) surface, valence-mending atoms include sulfur and selenium, while fluorine, chlorine and bromine serve as valence-mending atoms for the Si(111) surface. This surface passivation technique has been demonstrated to reduce contact resistance between Si and a proper metal, and at the same time reduce surface recombination velocity. The simultaneous reduction in contact resistance and surface recombination promises significantly improved efficiency in crystalline Si solar cells. This paper reviews our progress on valence-mended Si(100) surface as pertaining to photovoltaic applications and point out ways for cost-effective integration of this technique into crystalline Si solar cells.
  • Keywords
    Atomic layer deposition; Contact resistance; Crystallization; Ohmic contacts; Passivation; Photovoltaic cells; Radiative recombination; Schottky barriers; Silicon compounds; Surface resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2008. PVSC '08. 33rd IEEE
  • Conference_Location
    San Diego, CA, USA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-1640-0
  • Electronic_ISBN
    0160-8371
  • Type

    conf

  • DOI
    10.1109/PVSC.2008.4922639
  • Filename
    4922639