Title :
A knowledge-based inspection workstation
Author :
Messina, E. ; Horst, J. ; Kramer, T. ; Huang, H. ; Tsai, T. ; Amatucci, E.
Author_Institution :
Nat. Inst. of Stand. & Technol., USA
Abstract :
We are building an inspection workstation development environment to use as a testbed for understanding what types of knowledge, e.g. data, algorithms and processes, can increase the productivity of inspection operations. Inspection can be more efficient through reducing the need for fixturing, integrating the generation of process plans and their execution within the controller, and reducing the errors or data losses that occur by translating the models to different formats. The initial configuration of inspection systems can be less costly through the use of open architectures that are constructed from components. Key elements of our work include in-situ feature-based planning, vision-driven part pose estimation and software methods to facilitate construction of manufacturing controllers. These provide a rich environment in which to study the categories of knowledge that are useful in intelligent control of inspection workstations. This paper describes our vision, approach and preliminary results
Keywords :
automatic optical inspection; computer aided production planning; computer vision; computerised instrumentation; engineering workstations; image processing equipment; industrial control; intelligent control; components; cost; data loss reduction; error reduction; fixturing; in-situ feature-based planning; inspection operations productivity; intelligent control; knowledge-based inspection workstation; manufacturing controllers; model formats; model translation; open architectures; process plan execution; process plan generation; software methods; system configuration; vision-driven part pose estimation; workstation development environment; Computer architecture; Control systems; Coordinate measuring machines; Fixtures; Inspection; Intelligent control; Manufacturing; NIST; Testing; Workstations;
Conference_Titel :
Information Intelligence and Systems, 1999. Proceedings. 1999 International Conference on
Conference_Location :
Bethesda, MD
Print_ISBN :
0-7695-0446-9
DOI :
10.1109/ICIIS.1999.810264