Title :
Submicron InP DHBT Technology for High-Speed High-Swing Mixed-Signal ICs
Author :
Godin, J. ; Nodjiadjim, V. ; Riet, M. ; Berdaguer, P. ; Drisse, O. ; Derouin, E. ; Konczykowska, A. ; Moulu, J. ; Dupuy, J.-Y. ; Jorge, F. ; Gentner, J.L. ; Scavennec, A. ; Johansen, T. ; Krozer, V.
Author_Institution :
Alcatel Thales III-V Lab., Marcoussis
Abstract :
We report on the development of a submicron InP DHBT technology, optimized for the fabrication of ges50-GHz- clock mixed-signal ICs. In-depth study of device geometry and structure has allowed to get the needed performances and yield. Special attention has been paid to critical thermal behavior. Various size submicron devices have been modeled using UCSD- HBT equations. These large signal models have allowed the design of 50-GHz clocked 50 G Decision and 100 G Selector circuits. The high quality of the measured characteristics demonstrates the suitability of this technology for the various applications of interest, like 100 Gbit/s transmission.
Keywords :
III-V semiconductors; high-speed integrated circuits; indium compounds; integrated circuit design; integrated circuit modelling; mixed analogue-digital integrated circuits; DHBT technology; InP; UCSD-HBT equations; bit rate 100 Gbit/s; frequency 50 GHz; high-speed high-swing mixed-signal integrated circuits; Bridge circuits; Clocks; DH-HEMTs; Data conversion; Fabrication; Geometry; III-V semiconductor materials; Indium phosphide; Plugs; Thermal resistance;
Conference_Titel :
Compound Semiconductor Integrated Circuits Symposium, 2008. CSIC '08. IEEE
Conference_Location :
Monterey, CA
Print_ISBN :
978-1-4244-1939-5
Electronic_ISBN :
1550-8781
DOI :
10.1109/CSICS.2008.28