Title :
Relaxer ferroelectric polymers for actuators and transducers
Author :
Cheng, Z.-Y. ; Bharti, V. ; Zhao, X. ; Wang, Shexi ; Xu, T.-B. ; Zhang, Q.M.
Author_Institution :
Dept. of Electr. Eng., Pennsylvania State Univ., University Park, PA, USA
Abstract :
Ultra-high electrostrictive strains, both longitudinal and transverse strains, were observed in polyvinylidene fluoride-trifluoroethylene (P(VDF-TrFE)) copolymers under a proper electron irradiation treatment. In addition, in DC electric field biased states, the material also exhibits a high effective piezoelectric coefficient, comparable to those in piezoceramic PZT. The material also has a high dielectric constant and relative low dielectric loss. Moreover, these properties can be tailored in a broad range by the processing conditions. These features indicate that the material is attractive for high performance actuators and transducers. In this paper, electrostrictive strain, effective piezocoefficients, elastic, dielectric properties and polarization behavior of the material are reported. We will also show that the material exhibits typical relaxor ferroelectric behavior
Keywords :
dielectric losses; electron beam effects; electrostriction; ferroelectric materials; internal stresses; permittivity; piezoelectric actuators; piezoelectric transducers; polymer blends; DC electric field biased states; actuators; dielectric properties; effective piezocoefficients; elastic properties; electron irradiation treatment; electrostrictive strain; high dielectric constant; high effective piezoelectric coefficient; longitudinal strains; polarization behavior; polyvinylidene fluoride-trifluoroethylene copolymers; processing conditions; relative low dielectric loss; relaxor ferroelectric polymers; transducers; transverse strains; ultra-high electrostrictive strains; Actuators; Capacitive sensors; Dielectric losses; Dielectric materials; Electrons; Electrostriction; Ferroelectric materials; Piezoelectric materials; Piezoelectric transducers; Polymers;
Conference_Titel :
Ultrasonics Symposium, 1998. Proceedings., 1998 IEEE
Conference_Location :
Sendai
Print_ISBN :
0-7803-4095-7
DOI :
10.1109/ULTSYM.1998.762217