• DocumentCode
    338048
  • Title

    Acoustic reflectivity enhancement using higher-order nonlinear reflection mode

  • Author

    Maev, Roman G. ; Solodov, Igor Yu.

  • Author_Institution
    Dept. of Phys., Windsor Univ., Ont., Canada
  • Volume
    1
  • fYear
    1998
  • fDate
    1998
  • Firstpage
    707
  • Abstract
    Acoustic wave reflection is studied for sharp nonlinear inhomogeneities embedded into nonlinear medium with similar linear characteristics. The higher-order nonlinear reflection mode is used to increase the reflectivity of such inclusions “invisible” in a linearly reflected field. For YZ-LiNbO3 the discontinuity in nonlinear properties was measured to be the most dramatic for the SAW third harmonic generated in the area of the contact acoustic nonlinearity (simulating a closed crack) and acousto-electronic nonlinearity (piezoelectric-semiconductor structure). The experiments revealed from 3 to 4 orders of magnitude increase in reflectivity of the nonlinear inhomogeneities for the third-order nonlinear reflection mode
  • Keywords
    harmonic generation; inhomogeneous media; lithium compounds; nonlinear acoustics; surface acoustic waves; ultrasonic materials testing; ultrasonic reflection; LiNbO3; SAW third harmonic generation; YZ-LiNbO3; acoustic NDE; acoustic reflectivity enhancement; acousto-electronic nonlinearity; backward harmonics; closed crack simulation; contact acoustic nonlinearity; discontinuity in nonlinear properties; higher-order nonlinear reflection mode; invisible inclusions; nonlinear acoustic imaging; nonlinear medium; piezoelectric-semiconductor structure; sharp nonlinear inhomogeneities; similar linear characteristics; third-order nonlinear reflection mode; Acoustic materials; Acoustic measurements; Acoustic propagation; Acoustic reflection; Acoustic waves; Frequency conversion; Laboratories; Nonlinear acoustics; Physics; Reflectivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium, 1998. Proceedings., 1998 IEEE
  • Conference_Location
    Sendai
  • ISSN
    1051-0117
  • Print_ISBN
    0-7803-4095-7
  • Type

    conf

  • DOI
    10.1109/ULTSYM.1998.762246
  • Filename
    762246