• DocumentCode
    338050
  • Title

    Flow visualization of ultrasound-modulated two-fluid atomization

  • Author

    Tsai, S.C. ; Luu, P. ; Roski, G. ; Tsai, C.S.

  • Author_Institution
    Dept. of Chem. Eng., California State Univ., Long Beach, CA, USA
  • Volume
    1
  • fYear
    1998
  • fDate
    1998
  • Firstpage
    715
  • Abstract
    In this paper, we present flow visualizations of viscous liquid jets near the nozzle tip using a 30-nanosecond pulse laser as verifications of the initial and the jet boundary condition of a traveling capillary wave. Specifically, a bright band near the nozzle tip is seen in both ultrasonic and ultrasound-modulated two-fluid (UMTF) atomization, but not in two-fluid atomization. The bright band can be attributed to scattering of laser light sheet by the capillary wave generated by the ultrasound on the intact liquid jet. Good agreement between the jet breakup time calculated from this measured band length and that predicted by the modified Taylor´s dispersion relation has led to the conclusion that UMTF atomization occurs via Taylor-mode breakup of capillary waves. Note that UMTF atomization is capable of controlling the drop-size and size distribution of two-fluid atomization for uniform drop formation
  • Keywords
    capillary waves; drops; flow instability; flow visualisation; jets; laser velocimetry; nozzles; sprays; ultrasonic effects; Taylor-mode breakup; capillary wave breakup; drop size distribution; flow visualizations; initial condition; jet boundary condition; jet breakup time; modified Taylor´s dispersion relation; nozzle tip; scattering of laser light sheet; traveling capillary wave; ultrasound-modulated two-fluid atomization; uniform drop formation; viscous liquid jets; Atomic beams; Atomic measurements; Boundary conditions; Length measurement; Light scattering; Optical pulses; Time measurement; Ultrasonic imaging; Ultrasonic variables measurement; Visualization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium, 1998. Proceedings., 1998 IEEE
  • Conference_Location
    Sendai
  • ISSN
    1051-0117
  • Print_ISBN
    0-7803-4095-7
  • Type

    conf

  • DOI
    10.1109/ULTSYM.1998.762248
  • Filename
    762248