Title :
Gigascale integration (GSI) beyond 2001
Author :
Meindl, James D.
Author_Institution :
Rensselaer Polytech. Inst., Troy, NY, USA
Abstract :
Opportunities for gigascale integration (GSI) beyond the year 2001 are governed by a hierarchy of limits whose levels are fundamental, material, device, circuit and system. Theoretical limits are elucidated in the power versus delay (Ptd) plane for switching operations and in the square of the reciprocal length versus delay (L -2e) plane for transmission operations. The totality of practical limits is captured by three macrovariables; minimum feature size, chip area and number of transistors per minimum feature area. The singular metric which reveals the efficacy of a technology for GSI is the chip performance index (CPI) defined as the number of transistors per chip divided by the power-delay product of the technology. The CPI has increased by about 1013 since 1960 and is projected to increase still further by 106 by 2020
Keywords :
VLSI; technological forecasting; ULSI logic element; chip area; chip performance index; gigascale integration; hierarchy of limits; macrovariables; minimum feature size; number of transistors; power-delay product; transmission elements; Circuits; Conducting materials; Electrons; Gallium arsenide; Heat sinks; Logic; Solids; Thermal conductivity; Threshold voltage; Uncertainty;
Conference_Titel :
VLSI Technology, Systems, and Applications, 1991. Proceedings of Technical Papers, 1991 International Symposium on
Conference_Location :
Taipei
Print_ISBN :
0-7803-0036-X
DOI :
10.1109/VTSA.1991.246721