DocumentCode :
338082
Title :
A new theory for electroded piezoelectric plates and its finite element application for the forced vibrations analysis of quartz crystal resonators
Author :
Wang, Ji ; Yu, Jiun-Der ; Yong, Yook-Kong ; Imai, Tsutomu
Author_Institution :
Epson Palo Alto Lab., Palo Alto, CA, USA
Volume :
1
fYear :
1998
fDate :
1998
Firstpage :
913
Abstract :
For crystal resonators, it is always desirable to calculate the electric properties accurately for application purposes. As an extension of the Mindlin plate theory based finite element analysis of crystal resonators, a new theory for the electroded plates is derived and the piezoelectrically forced vibrations are formulated and implemented in this paper in a manner similar to our previous work. The effect of the electrodes and the electric boundary conditions are taken into considerations through the modification of the higher-order plate equations by changing the expansion function of the electric potential for this particular problem. Through the conventional discretization of the new plate theory, the linear equations for the piezoelectric plate under thickness excitation are constructed and solved with efficient numerical computation techniques such as the sparse matrix handling. Numerical examples showing good predictions of the resonance frequency and capacitance ratio of electroded crystal plates of AT-cut quartz are presented with experimental data
Keywords :
crystal resonators; finite element analysis; quartz; sparse matrices; vibrations; Mindlin theory; boundary conditions; capacitance ratio; discretization; electric potential; electrical properties; electroded piezoelectric plate; finite element model; forced vibration analysis; numerical method; quartz crystal resonator; resonance frequency; sparse matrix; Boundary conditions; Ear; Electric potential; Electrodes; Equations; Finite element methods; Laboratories; Open wireless architecture; Resonance; Resonant frequency;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics Symposium, 1998. Proceedings., 1998 IEEE
Conference_Location :
Sendai
ISSN :
1051-0117
Print_ISBN :
0-7803-4095-7
Type :
conf
DOI :
10.1109/ULTSYM.1998.762292
Filename :
762292
Link To Document :
بازگشت