Title :
Reliability testing beyond Qualification as a key component in photovoltaic´s progress toward grid parity
Author :
Wohlgemuth, John H. ; Kurtz, Sarah
Author_Institution :
Nat. Renewable Energy Lab., Golden, CO, USA
Abstract :
This paper discusses why it is necessary for new lower cost PV modules to be tested using a reliability test sequence that goes beyond the Qualification test sequence now utilized for modules. Today most PV modules are warranted for 25 years, but the Qualification Test Sequence does not test for 25-year life. There is no accepted test protocol to validate a 25-year lifetime. This paper recommends the use of long term accelerated testing to compare now designs directly with older designs that have achieved long lifetimes in outdoor exposure. If the new designs do as well or better than the older ones, then it is likely that they will survive an equivalent length of time in the field.
Keywords :
power markets; reliability; solar cells; testing; PV module; photovoltaic market; qualification test sequence; reliability test sequence; IEC standards; Life estimation; Materials; Qualifications; Reliability; Stress; Testing; Grid Parity; Levelized Cost of Electricity (LCOE); Photovoltaic module reliability; Qualification Testing; Reliability Testing;
Conference_Titel :
Reliability Physics Symposium (IRPS), 2011 IEEE International
Conference_Location :
Monterey, CA
Print_ISBN :
978-1-4244-9113-1
Electronic_ISBN :
1541-7026
DOI :
10.1109/IRPS.2011.5784534