• DocumentCode
    3380934
  • Title

    The role of elastic and plastic anisotropy of Sn on microstructure and damage evolution in lead-free solder joints

  • Author

    Bieler, Thomas R. ; Zhou, Bite ; Blair, Lauren ; Zamiri, Amir ; Darbandi, Payam ; Pourboghrat, Farhang ; Lee, Tae-Kyu ; Liu, Kuo-Chuan

  • Author_Institution
    Chem. Eng. & Mater. Sci., Michigan State Univ., East Lansing, MI, USA
  • fYear
    2011
  • fDate
    10-14 April 2011
  • Abstract
    The elastic, thermal expansion, and plastic anisotropy of Sn is examined to assess how anisotropy affects the microstructural evolution and damage nucleation processes in SAC305 solder joints. Examination of all joints in a package indicates that upon solidification, crystal orientations are nearly randomly distributed. Initial studies of cracked joints after thermal cycling showed that orientations with the c-axis parallel to the joint interface (red orientations) are more likely to crack arising from tensile stresses during the hot part of the cycle. Subsequent studies show that package design has a large influence on how the microstructure evolves; higher strain designs stimulate recrystallization at earlier times. Recrystallization appears to be strongly correlated with crack nucleation and propagation processes, as red orientations often develop and lead to crack nucleation and propagation. The details of the recrystallization process depend strongly on the plastic slip and recovery processes arising from the specific crystal orientation/temperature/strain history that makes microstructural evolution of each joint unique. The unique history for each joint implies that worst case scenarios need to be identified and models developed that can predict microstructural evolution that leads to worst case scenarios.
  • Keywords
    recrystallisation; solders; thermal expansion; Sn; damage evolution; damage nucleation; elastic anisotropy; lead-free solder joints; microstructural evolution; microstructure; plastic anisotropy; recrystallization; Crystals; Joints; Microstructure; Soldering; Strain; Stress; Tin; Sn; anisotropy; damage; microstructure; slip systems; thermal cycling; thermal expansion;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium (IRPS), 2011 IEEE International
  • Conference_Location
    Monterey, CA
  • ISSN
    1541-7026
  • Print_ISBN
    978-1-4244-9113-1
  • Electronic_ISBN
    1541-7026
  • Type

    conf

  • DOI
    10.1109/IRPS.2011.5784538
  • Filename
    5784538