Title :
Minority carrier dynamics in polycrystalline silicon solar cells studied by photo-assisted Kelvin probe force microscopy
Author :
Takihara, Masaki ; Ujihara, Toru ; Takahashi, Takuji
Author_Institution :
Institute of Industrial Science, University of Tokyo, 4-6-1 Komaba, Meguro-ku, 153-8505 Japan
Abstract :
In a solar cell material, minority carrier dynamics such as diffusion length and lifetime are very important because they strongly influence on solar cell performance. In this study, we proposed a method for diffusion length and lifetime measurements by photo-assisted Kelvin probe force microscopy (P-KFM), and investigated the diffusion length and lifetime distribution around a grain boundary in a polycrystalline silicon solar cell.
Keywords :
Atomic force microscopy; Force measurement; Kelvin; Length measurement; Optical modulation; Optical surface waves; Photovoltaic cells; Probes; Silicon; Wavelength measurement;
Conference_Titel :
Photovoltaic Specialists Conference, 2008. PVSC '08. 33rd IEEE
Conference_Location :
San Diego, CA, USA
Print_ISBN :
978-1-4244-1640-0
Electronic_ISBN :
0160-8371
DOI :
10.1109/PVSC.2008.4922689