Title :
RRA-based multi-objective optimization to mitigate the worst cases of placement
Author :
Sheng, Yiqiang ; Takahashi, Atsushi ; Ueno, Shuichi
Author_Institution :
Dept. of Commun. & Integrated Syst., Tokyo Inst. of Technol., Tokyo, Japan
Abstract :
As VLSI/PCB design keeps going through higher complexity, it is increasingly important to mitigate the worst cases of placement in physical design in order to get an acceptable solution within shorter runtime. This paper mainly focuses on the worst-case mitigation for multi-objective placement by using relay-race algorithm (RRA). Several intuitive advantages of RRA are discussed by comparing with simulated annealing (SA) and genetic algorithm (GA). MCNC and ami49_X benchmarks are used to test the effectiveness of RRA for placement with multiple objectives. Based on the experimental data comparing with SA, RRA obtains near 24% worst-case improvement for interconnect power consumption on average without any degradation of maximal delay. With respect to area minimization, RRA gets worst-case improvement for all tested benchmarks with near 50% runtime of SA (2X speedup).
Keywords :
VLSI; benchmark testing; genetic algorithms; power consumption; printed circuit design; simulated annealing; MCNC benchmark; PCB design; RRA-based multiobjective optimization; VLSI design; ami49_X benchmark; area minimization; genetic algorithm; interconnect power consumption; multiobjective placement; physical design; relay-race algorithm; simulated annealing; worst-case mitigation; Annealing; Benchmark testing; Design automation; Runtime; CAD technique; VLSI/PCB design; multi-objective optimization; physical design; relay-race algorithm;
Conference_Titel :
ASIC (ASICON), 2011 IEEE 9th International Conference on
Conference_Location :
Xiamen
Print_ISBN :
978-1-61284-192-2
Electronic_ISBN :
2162-7541
DOI :
10.1109/ASICON.2011.6157188