DocumentCode
3381168
Title
Design of pseudoexhaustive testable PLA with low overhead
Author
Shen, Wen-Zen ; Hwang, Gwo-Haur ; Hsu, Wen-Jun ; Jan, Yun-Jung
Author_Institution
Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsin Chu, Taiwan
fYear
1991
fDate
22-24 May 1991
Firstpage
409
Lastpage
413
Abstract
The pseudoexhaustive testing (PET) scheme is an economic approach to test a large embedded PLA. In this paper, the authors propose an efficient algorithm named lower overhead PET (LOPET) to partition the product lines. By applying the algorithm, both the area overhead and test length are reduced significantly
Keywords
logic arrays; logic design; logic testing; LOPET; PET; area overhead; embedded PLA; overhead; product lines; pseudoexhaustive testable PLA; test length; Algorithm design and analysis; Built-in self-test; Circuit testing; Electronic equipment testing; Partitioning algorithms; Positron emission tomography; Programmable logic arrays; Shift registers; Test pattern generators; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Technology, Systems, and Applications, 1991. Proceedings of Technical Papers, 1991 International Symposium on
Conference_Location
Taipei
ISSN
1524-766X
Print_ISBN
0-7803-0036-X
Type
conf
DOI
10.1109/VTSA.1991.246751
Filename
246751
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