Experimental circuit modeling of coupled interconnection structures based on causality

Author

Sercu, S. ; Martens, L.

Author_Institution

Dept. of Inf. Technol., Ghent Univ., Belgium

fYear

1995

fDate

2-4 Oct 1995

Firstpage

120

Lastpage

122

Abstract

In this paper a time-frequency domain technique for the experimental circuit modeling of coupled two-port interconnection structures and discontinuities is presented. The technique models and de-embeds each appearing discontinuity and coupled substructure of the DUT one by one, and is based on the principle of causality. To validate the accuracy of the circuit models, measured reflection, transmission, near-end and far-end crosstalk are compared with simulated results

Keywords

crosstalk; frequency-domain analysis; integrated circuit interconnections; integrated circuit modelling; integrated circuit packaging; physics fundamentals; time-frequency analysis; two-port networks; causality; circuit modeling; coupled interconnection structures; coupled substructure; far-end crosstalk; interconnection discontinuities; near-end crosstalk; reflection; time-frequency domain technique; transmission; two-port interconnection structures; Circuit testing; Coupling circuits; Crosstalk; Delay; Distributed parameter circuits; Impedance; Integrated circuit interconnections; Reflection; Time measurement; Transmission line measurements;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Performance of Electronic Packaging, 1995

Conference_Location

Portland, OR

Print_ISBN

0-7803-3034-X

Type

conf

DOI

10.1109/EPEP.1995.524869

Filename

524869