• DocumentCode
    3381227
  • Title

    Extreme Narrow Gap Surface Micromachined Pirani Pressure Sensor

  • Author

    Khosraviani, K. ; Leung, A.M.

  • Author_Institution
    Simon Fraser Univ., Burnaby
  • fYear
    2007
  • fDate
    10-14 June 2007
  • Firstpage
    2251
  • Lastpage
    2254
  • Abstract
    This paper presents an innovative surface micromachined Pirani pressure sensor with an extreme narrow gap and with atmospheric operating pressure range. By using a very thin layer of sputtered silicon as a sacrificial layer and Xenon Difluoride (XeF2) gas phase etching technique, a 25 nm gap was fabricated between a heated microbridge and the substrate (heatsink). The gas phase etching of the sacrificial layer eliminates the liquid´s surface tension that may cause the microbridge to collapse onto the substrate during the releasing and drying steps, therefore, usage of Critical Point Drying (CPD) technique is not necessary. Such a narrow gap pushes the upper pressure operating range of the sensor up to several atmospheres. Experimental results show significant sensitivity to absolute pressure up to 94.5 psi on a device with an active area as small as 250 mum2.
  • Keywords
    etching; micromachining; microsensors; pressure sensors; silicon; sputtered coatings; substrates; xenon compounds; distance 25 nm; gas phase etching technique; heated microbridge; narrow gap surface micromachined Pirani pressure sensor; sacrificial thin layer; sputtered silicon; substrate; Atmosphere; Bridges; Dry etching; Fabrication; Silicon; Sputter etching; Surface tension; Tensile stress; Thermal sensors; Xenon; Micromachining; Nano-gap; Pirani; Xenon Difluoride;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Sensors, Actuators and Microsystems Conference, 2007. TRANSDUCERS 2007. International
  • Conference_Location
    Lyon
  • Print_ISBN
    1-4244-0842-3
  • Electronic_ISBN
    1-4244-0842-3
  • Type

    conf

  • DOI
    10.1109/SENSOR.2007.4300617
  • Filename
    4300617