Title :
Extreme Narrow Gap Surface Micromachined Pirani Pressure Sensor
Author :
Khosraviani, K. ; Leung, A.M.
Author_Institution :
Simon Fraser Univ., Burnaby
Abstract :
This paper presents an innovative surface micromachined Pirani pressure sensor with an extreme narrow gap and with atmospheric operating pressure range. By using a very thin layer of sputtered silicon as a sacrificial layer and Xenon Difluoride (XeF2) gas phase etching technique, a 25 nm gap was fabricated between a heated microbridge and the substrate (heatsink). The gas phase etching of the sacrificial layer eliminates the liquid´s surface tension that may cause the microbridge to collapse onto the substrate during the releasing and drying steps, therefore, usage of Critical Point Drying (CPD) technique is not necessary. Such a narrow gap pushes the upper pressure operating range of the sensor up to several atmospheres. Experimental results show significant sensitivity to absolute pressure up to 94.5 psi on a device with an active area as small as 250 mum2.
Keywords :
etching; micromachining; microsensors; pressure sensors; silicon; sputtered coatings; substrates; xenon compounds; distance 25 nm; gas phase etching technique; heated microbridge; narrow gap surface micromachined Pirani pressure sensor; sacrificial thin layer; sputtered silicon; substrate; Atmosphere; Bridges; Dry etching; Fabrication; Silicon; Sputter etching; Surface tension; Tensile stress; Thermal sensors; Xenon; Micromachining; Nano-gap; Pirani; Xenon Difluoride;
Conference_Titel :
Solid-State Sensors, Actuators and Microsystems Conference, 2007. TRANSDUCERS 2007. International
Conference_Location :
Lyon
Print_ISBN :
1-4244-0842-3
Electronic_ISBN :
1-4244-0842-3
DOI :
10.1109/SENSOR.2007.4300617