DocumentCode
3381245
Title
A COPLANAR WAVEGUIDE PROBE WITH APPLICATIONS TO THIN FILM DIELECTRIC MEASUREMENTS
Author
Seltmann, E.W. ; Laskar, J. ; Smith, K. ; Gleason, R.
fYear
1995
fDate
2-4 Oct 1995
Firstpage
127
Keywords
Admittance; Coaxial components; Coplanar waveguides; Dielectric loss measurement; Dielectric materials; Dielectric measurements; Dielectric thin films; Permittivity measurement; Probes; Scattering parameters;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Performance of Electronic Packaging, 1995
Print_ISBN
0-7803-3034-X
Type
conf
DOI
10.1109/EPEP.1995.524872
Filename
524872
Link To Document