Title :
A COPLANAR WAVEGUIDE PROBE WITH APPLICATIONS TO THIN FILM DIELECTRIC MEASUREMENTS
Author :
Seltmann, E.W. ; Laskar, J. ; Smith, K. ; Gleason, R.
Keywords :
Admittance; Coaxial components; Coplanar waveguides; Dielectric loss measurement; Dielectric materials; Dielectric measurements; Dielectric thin films; Permittivity measurement; Probes; Scattering parameters;
Conference_Titel :
Electrical Performance of Electronic Packaging, 1995
Print_ISBN :
0-7803-3034-X
DOI :
10.1109/EPEP.1995.524872
