• DocumentCode
    3381289
  • Title

    Compact Multilayer Piezoresistive Gauge for In-Plane Strain Measurment in Liquids

  • Author

    Bureau, Jean-Baptiste ; Legrand, Bernard ; Collard, Dominique ; Buchaillot, Lionel

  • Author_Institution
    IEMN CNRS UMR, Orsay
  • fYear
    2007
  • fDate
    10-14 June 2007
  • Firstpage
    2267
  • Lastpage
    2270
  • Abstract
    This paper presents an original piezoresistive strain gauge architecture based on two polysilicon layers able to sense in-plane strain. These gauges are electrically isolated from the external environment in order to be used in liquids. The presented design is based on three optimization keypoints, which one of these allows the reduction of the beam width thus leading to an increased sensitivity in force. Design, modelling, fabrication and characterization have been investigated. An in-plane sensitivity of 30 x 10-6 muN-1 has been obtained which is comparable to out of plane sensitivity, typically obtained with AFM cantilevers.
  • Keywords
    elemental semiconductors; multilayers; piezoelectric transducers; silicon; strain gauges; strain measurement; Si; beam width reduction; electromechanical transducer; in-plane strain measurement; multilayer piezoresistive strain gauge; polysilicon layers; Arm; Atomic force microscopy; Capacitive sensors; Force measurement; Liquids; Nonhomogeneous media; Piezoresistance; Solid state circuits; Strain measurement; Transducers; lateral detection; piezoresistivity; polysilicon; strain gauge;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Sensors, Actuators and Microsystems Conference, 2007. TRANSDUCERS 2007. International
  • Conference_Location
    Lyon
  • Print_ISBN
    1-4244-0842-3
  • Electronic_ISBN
    1-4244-0842-3
  • Type

    conf

  • DOI
    10.1109/SENSOR.2007.4300621
  • Filename
    4300621