• DocumentCode
    3381304
  • Title

    Thermal Characterization of Porous Silicon Micro-Hotplates using IR Thermography

  • Author

    Triantafyllopoulou, R. ; Tsamis, C. ; Chatzandroulis, S. ; Speliotis, T. ; Parthenios, J. ; Papagelis, K. ; Galiotis, C.

  • Author_Institution
    NCSR, Athens
  • fYear
    2007
  • fDate
    10-14 June 2007
  • Firstpage
    2271
  • Lastpage
    2274
  • Abstract
    In this work we used combined IR measurements with a thermocamera as well as electrical measurements in vacuum, in order to accurately estimate the temperature that develops on porous silicon micro-hotplates of various designs. An overall emissivity value epsiv=0.25 has been used, obtained from the simulation of the electrical data for various micro hotplate designs. The estimated temperature is in good agreement with the simulated results.
  • Keywords
    emissivity; infrared imaging; microsensors; porous materials; silicon; IR measurement; IR thermography; Si; electrical measurement; emissivity value; porous silicon microhotplates; thermal characterization; thermocamera; Electric variables measurement; Fabrication; Infrared sensors; Materials science and technology; Sensor arrays; Sensor systems; Silicon; Structural beams; Temperature sensors; Thermal conductivity; IR thermography; Micro-hotplates; Porous Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Sensors, Actuators and Microsystems Conference, 2007. TRANSDUCERS 2007. International
  • Conference_Location
    Lyon
  • Print_ISBN
    1-4244-0842-3
  • Electronic_ISBN
    1-4244-0842-3
  • Type

    conf

  • DOI
    10.1109/SENSOR.2007.4300622
  • Filename
    4300622