DocumentCode :
338138
Title :
Digital test program generation - overview
Author :
Henckels, L.P. ; Haas, R.M. ; Brown, K.M.
fYear :
1978
fDate :
1978
Firstpage :
28
Lastpage :
30
Keywords :
Assembly; Automatic testing; Circuit faults; Circuit testing; Dictionaries; Fault diagnosis; Large scale integration; Logic testing; Probes; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON '78. International Automatic Testing Conference
Type :
conf
DOI :
10.1109/AUTEST.1978.764230
Filename :
764230
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=338138
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