• DocumentCode
    338150
  • Title

    An approach to ate/uut functional matching

  • Author

    Granieri, Michael ; Paffenroth, Gary ; Ransom, Diane ; Schmitt, William

  • Author_Institution
    ManTech of New Jersey Corporation
  • fYear
    1978
  • fDate
    1978
  • Firstpage
    351
  • Lastpage
    360
  • Keywords
    Automatic test equipment; Circuit testing; Hardware; Histograms; Large-scale systems; Manufacturing; Radio frequency; System testing; Test equipment; Weapons;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON '78. International Automatic Testing Conference
  • Type

    conf

  • DOI
    10.1109/AUTEST.1978.764394
  • Filename
    764394
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=338150