Title :
Spectral Signature Calculations for Remote Sensing
Author :
Yeary, M. ; Yu, T.-Y. ; Nematifar, S. ; Shapiro, A.
Author_Institution :
Sch. of Electr. & Comput. Eng., Oklahoma Univ., Norman, OK
Abstract :
Remote sensing radar has shown to be an important tool to observe severe and hazardous weather and to provide operational forecasters prompt information of such rapidly evolving phenomena. Although the history of tornado measurements is long, there have been only a few successes in obtaining spectral signatures. This is largely because neither the technology to process spectra nor the technology to record voluminous amounts of time series data were available, except for a few customized systems. However, present day radar technology and computer resources are now advanced enough to study tornado spectral signature in a systematic manner. The research WSR-88D (weather surveillance radar) locally operated by the National Severe Storm Laboratory (NSSL) in Norman has the unique capability of collecting massive volumes of Level I time series data over many hours which provides a rich environment for evaluating our new post-processing algorithms. In this work, an approach of identifying tornado vortices in Doppler spectra is proposed and investigated through the use of neural networks
Keywords :
Doppler radar; computerised instrumentation; meteorological radar; neural nets; remote sensing by radar; spectral analysis; storms; time series; Doppler spectra; neural networks; remote sensing radar; spectral signature calculations; time series data; tornado vortices identification; weather surveillance radar; Doppler radar; History; Meteorological radar; Remote sensing; Senior members; Storms; Student members; Tornadoes; Weather forecasting; Wind; WSR-88D (KOUN); and real-time sensor instrumentation; digital signal processing; radar measurements; remote sensing; sensor networks; spectral signature calculations;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2005. IMTC 2005. Proceedings of the IEEE
Conference_Location :
Ottawa, Ont.
Print_ISBN :
0-7803-8879-8
DOI :
10.1109/IMTC.2005.1604538