• DocumentCode
    3381791
  • Title

    A 10-Bit, 50 MS/s, 55 fJ/conversion-step SAR ADC with split capacitor array

  • Author

    Cho, Seong-Jin ; Hong, Yohan ; Yoo, Taegeun ; Baek, Kwang-Hyun

  • Author_Institution
    Sch. of Electr. & Electron. Eng., Chung-Ang Univ., Seoul, South Korea
  • fYear
    2011
  • fDate
    25-28 Oct. 2011
  • Firstpage
    472
  • Lastpage
    475
  • Abstract
    In this paper, a split capacitor array structure for successive approximation register (SAR) ADC is proposed. By connecting the node of upper plate of LSB capacitor arrays to the reference voltage while MSB operation is activated, the proposed ADC can alleviate the problem of parasitic capacitance without using extra calibration circuitry and conversion cycles. The proposed ADC is designed using 0.13-um 1P6M CMOS technology. At a 1.2-V supply and 50 MS/s, the ADC achieves an SNDR of 56.9 dB and consumes 1.58 mW, resulting in a figure of merit (FOM) of 55 fJ/conversion-step. The ADC core occupies an active area of 350 × 440 um2.
  • Keywords
    CMOS integrated circuits; analogue-digital conversion; capacitors; low-power electronics; 1P6M CMOS technology; FOM; LSB capacitor arrays; MSB operation; SNDR; conversion cycles; conversion-step SAR ADC; extra calibration circuitry; figure of merit; gain 56.9 dB; parasitic capacitance; power 1.58 mW; size 0.13 mum; split capacitor array structure; successive approximation register; voltage 1.2 V; word length 10 bit; Indexes; Analog-to-digital converter (ADC); attenuation capacitor; split capacitor array; successive approximation register (SAR);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ASIC (ASICON), 2011 IEEE 9th International Conference on
  • Conference_Location
    Xiamen
  • ISSN
    2162-7541
  • Print_ISBN
    978-1-61284-192-2
  • Electronic_ISBN
    2162-7541
  • Type

    conf

  • DOI
    10.1109/ASICON.2011.6157224
  • Filename
    6157224