Title :
13-bit 205 MS/s time-interleaved pipelined ADC with digital background calibration
Author :
Mohsen, Mohamed ; Dessouky, Mohamed
Author_Institution :
Silicon Vision LLC., Cairo, Egypt
fDate :
May 30 2010-June 2 2010
Abstract :
This paper presents a 1.0-V 13-bit 205-MSample/s double-sampled pipelined analog-to-digital converter (ADC) with a 95-dB spurious free dynamic range (SFDR), a 75.5-dB signal-to-noise-plus-distortion ratio (SNDR) over the full Nyquist band and a total power consumption of 71 mW. This performance is enabled by digital background calibration of both capacitor mismatch in the multi-bit DAC and finite inter-stage gain errors. M-sequence characteristics was used for the generation of the multiple orthogonal codes needed in the calibration engine. Also, a simple design for the dithered re-quantizer which precedes calibration is adopted. Digital calibration achieves an improvement of better than 23-dB in SFDR and 13-dB in SNDR.
Keywords :
analogue-digital conversion; calibration; m-sequences; orthogonal codes; M-sequence characteristics; capacitor mismatch; digital background calibration; dithered requantizer design; double-sampled pipelined analog-to-digital converter; finite interstage gain errors; full Nyquist band; multibit DAC; multiple orthogonal codes; power 71 mW; signal-to-noise-plus-distortion ratio; spurious free dynamic range; time-interleaved pipelined ADC; total power consumption; voltage 1.0 V; word length 13 bit; Analog-digital conversion; Autocorrelation; CMOS technology; Calibration; Capacitors; Energy consumption; Error correction; Logic; Shift registers; Signal resolution;
Conference_Titel :
Circuits and Systems (ISCAS), Proceedings of 2010 IEEE International Symposium on
Conference_Location :
Paris
Print_ISBN :
978-1-4244-5308-5
Electronic_ISBN :
978-1-4244-5309-2
DOI :
10.1109/ISCAS.2010.5537535