Title :
CMOS low-power subthreshold reference voltage utilizing self-biased body effect
Author :
Hao, Zhang ; Yimeng, Zhang ; Mengshu, Huang ; Tsutomu, Yoshihara
Author_Institution :
Grad. Sch. of Inf., Production & Syst., Waseda Univ., Kitakyushu, Japan
Abstract :
Two novel voltage reference using self-biased body effect are discussed in this paper. The proposed circuits based on the weighted difference of two gate-source voltages of two MOSFETs operated in subthreshold region and one of them with forward-biased body effect, can generate two ultra-low reference voltages of 171.1 mV and 243.2 mV with temperature coefficients of 15.6 ppm/°C and 14.8 ppm/°C in a range from -25°C~80°C, respectively. The voltage line sensitivities are 0.0025%/V and 0.0019%/V. The power supply rejection ratio (PSRR) are -110 dB and -105 dB at 100 Hz. The power dissipations are 0.74 μW and 1.4 μW at a 1.4-V power supply. The circuits were designed and simulated in 0.18 μm CMOS technology. The layouts illustrate the chip area are 0.016 mm2 and 0.014 mm2.
Keywords :
CMOS integrated circuits; low-power electronics; reference circuits; CMOS; MOSFET; forward-biased body effect; frequency 100 Hz; power 0.74 muW; power 1.4 muW; power supply rejection ratio; self-biased body effect; size 0.18 mum; temperature -25 C to 80 C; voltage 1.4 V; voltage 171.1 mV; voltage 243.2 mV; voltage reference; CMOS integrated circuits; Equations; MOSFET circuits; MOSFETs; Mathematical model; Resistors; Threshold voltage; CMOS voltage reference; area efficient; body effect; low power; subthreshold;
Conference_Titel :
ASIC (ASICON), 2011 IEEE 9th International Conference on
Conference_Location :
Xiamen
Print_ISBN :
978-1-61284-192-2
Electronic_ISBN :
2162-7541
DOI :
10.1109/ASICON.2011.6157235