• DocumentCode
    3382230
  • Title

    Modeling, simulation, inversion and Chang E-1 data validation for microwave emission remote sensing of lunar surface media

  • Author

    Jin, Ya-Qiu ; Fa, Wenzhe

  • Author_Institution
    Key Lab. of Wave Scattering & Remote Sensing Inf. (MoE), Fudan Univ., Shanghai, China
  • fYear
    2010
  • fDate
    25-30 July 2010
  • Firstpage
    3063
  • Lastpage
    3066
  • Abstract
    In China´s first lunar exploration project, Chang-E 1 (CE-1), a multi-channel (3.0, 7.8, 19.35 and 37GHz) microwave radiometer in passive microwave remote sensing, was first aboard the satellite, with the purpose of measuring microwave brightness temperature (Tb) from lunar surface and surveying the global distribution of lunar regolith layer thickness. In this paper, some works on this mission, including the microwave emission modeling and Tb simulation of lunar surface media, CE-1 data validation and retrieval of lunar regolith layer thickness from multi-channel CE-1 Tb data, and evaluation of global inventory of Helium-3 in lunar regolith, are reported.
  • Keywords
    aerospace instrumentation; astronomical spectra; lunar surface; radioastronomical techniques; radioastronomy; radiometers; remote sensing; Chang E-1 data inversion; Chang E-1 data validation; frequency 19.35 GHz; frequency 3.0 GHz; frequency 37 GHz; frequency 7.8 GHz; global lunar regolith helium-3 inventory; lunar exploration project; lunar regolith layer thickness; lunar surface media; microwave brightness temperature; microwave emission modeling; microwave emission remote sensing; multichannel microwave radiometer; passive microwave remote sensing; Brightness temperature; Media; Microwave measurements; Microwave radiometry; Moon; Soil; Temperature measurement; 3He; Chang-E; regolith layer;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium (IGARSS), 2010 IEEE International
  • Conference_Location
    Honolulu, HI
  • ISSN
    2153-6996
  • Print_ISBN
    978-1-4244-9565-8
  • Electronic_ISBN
    2153-6996
  • Type

    conf

  • DOI
    10.1109/IGARSS.2010.5654443
  • Filename
    5654443