DocumentCode :
3382306
Title :
Scanning Electron Microscopy for Vacuum Quality Factor Measurement of Small-Size Mechanical Resonators
Author :
Gilles, J.P. ; Megherbi, S. ; Raynaud, G. ; Parrain, F. ; Mathias, H. ; Bosseboeuf, A.
Author_Institution :
Univ. Paris-Sud, Orsay
fYear :
2007
fDate :
10-14 June 2007
Firstpage :
2501
Lastpage :
2504
Abstract :
Many micro-electro-mechanical-system (MEMS) are based on the use of resonant mechanical structures. In this paper, we propose scanning electron microscopy techniques that allow a direct characterization of in-plane vibrations of small-size resonators. Implementation and performance of these techniques are illustrated by vacuum quality factor measurements of an electrostatically-driven polysilicon Tang resonator and of a high Q silicon cantilever microbeam excited with an external piezoelectric actuator. These techniques are also expected to be suitable for the dynamical characterization of nanoresonators.
Keywords :
Q-factor measurement; beams (structures); cantilevers; elemental semiconductors; frequency response; micromechanical resonators; piezoelectric actuators; scanning electron microscopy; silicon; vacuum techniques; vibration measurement; Si; electrostatically-driven polysilicon Tang resonator; external piezoelectric actuator; high Q silicon cantilever microbeam; microelectro-mechanical-system; nanoresonator dynamical characterization; resonant mechanical structures; scanning electron microscopy; small-size mechanical resonators; vacuum quality factor measurement; vibrations characterization; Electrostatic measurements; Mechanical variables measurement; Micromechanical devices; Q factor; Q measurement; Resonance; Scanning electron microscopy; Silicon; Vacuum technology; Vibrations; MEMS; NEMS; Q-factor; SEM; resonator;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Sensors, Actuators and Microsystems Conference, 2007. TRANSDUCERS 2007. International
Conference_Location :
Lyon
Print_ISBN :
1-4244-0842-3
Electronic_ISBN :
1-4244-0842-3
Type :
conf
DOI :
10.1109/SENSOR.2007.4300679
Filename :
4300679
Link To Document :
بازگشت