• DocumentCode
    3382309
  • Title

    Distortion analysis of 30Gsample/s CMOS switched source follower

  • Author

    Liang, Hailang ; Evans, Rob J. ; Skandas, E.

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Univ. of Melbourne, Melbourne, VIC, Australia
  • fYear
    2010
  • fDate
    May 30 2010-June 2 2010
  • Firstpage
    4293
  • Lastpage
    4296
  • Abstract
    Volterra analysis of the ultra high-speed CMOS switched source follower (SSF) track and hold amplifier (THA) is presented based on a simplified RF model. Approximate expressions for the transfer function, the harmonic equations and third-order intermodulation distortion equation are derived respectively. Simulations based on a commercial available 65 nm CMOS process technology are performed with the SpectreRF circuit simulator. It is shown that when operating with ultra high input frequency, the total harmonic distortion (THD) linearity degrades progressively. Comparative SpectreRF simulated results for SSF THA have shown good agreement with Volterra analytical results by using the simplified BSIM4 RF model.
  • Keywords
    CMOS analogue integrated circuits; circuit simulation; distortion; harmonic analysis; network analysis; radiofrequency amplifiers; radiofrequency integrated circuits; sample and hold circuits; BSIM4 RF model; SpectreRF circuit simulator; Volterra analysis; distortion analysis; harmonic distortion; size 65 mm; track and hold amplifier; ultra high speed CMOS switched source follower; CMOS process; CMOS technology; Circuit simulation; Equations; Intermodulation distortion; Radio frequency; Radiofrequency amplifiers; Semiconductor device modeling; Total harmonic distortion; Transfer functions; CMOS switched source follower; RF model; Track and hold amplifier; Volterra analysis; buffer; harmonic distortion; ultra high speed;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (ISCAS), Proceedings of 2010 IEEE International Symposium on
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4244-5308-5
  • Electronic_ISBN
    978-1-4244-5309-2
  • Type

    conf

  • DOI
    10.1109/ISCAS.2010.5537557
  • Filename
    5537557