The use of test structures for characterization of back-contact silicon solar cells

Back-contact crystalline-silicon solar cells frequently have more complicated device geometry compared to conventional silicon solar cells where carrier transport is inherently multidimensional. This paper describes the use of test structures for characterizing the device performance of emitter-wrap-through back-contact silicon solar cells. These device structures are fabricated using the same process as the production line and are designed to isolate a specific component of concern. Key elements of the device structure can also be systematically varied to understand the impact of the component and to help establish design rules. The use of such device structures for characterizing components of series resistance and of recombination current is described.