DocumentCode :
3382347
Title :
In-Situ TEM Observation of Crystal-Facet-Dependent Self-Rearranging Gold Atoms Under Tensile Stress Controlled by MEMS Nanoprobe Positioner
Author :
Ishida, Tadashi ; Kakushima, Kuniyuki ; Mita, Makoto ; Toshiyoshi, Hiroshi ; Fujita, Hiroyuki
Author_Institution :
Univ. of Tokyo, Tokyo
fYear :
2007
fDate :
10-14 June 2007
Firstpage :
2505
Lastpage :
2508
Abstract :
We have newly observed the gold atom migration and rearrangement at the artificially made point contact in a well controlled manner using microactuated probes with nano positioning accuracy. In-situ TEM observation revealed that the initial gold facet before contact strongly influences the shape of a nanobridge during the tensile test. Crystallographic facets of (211 macr), (101 macr) and (110 macr) at the nanocontact correspond to the formation of an inhomogeneous nanowire, a thinned nanocontact, and a homogeneous nano-contact, respectively.
Keywords :
crystallography; micromechanical devices; probes; transmission electron microscopy; MEMS nanoprobe positioner; TEM; crystal-facet-dependent self-rearranging gold atoms; crystallographic facets; gold atom migration; inhomogeneous nanowire; microactuated probes; tensile stress; thinned nanocontact; Electrodes; Etching; Gold; Micromechanical devices; Probes; Shape; Silicon; Stress control; Tensile stress; Transmission electron microscopy; Gold Nanocontact; MEMS Opposing Tips; Self Rearrangement; Transmission Electron Microscope;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Sensors, Actuators and Microsystems Conference, 2007. TRANSDUCERS 2007. International
Conference_Location :
Lyon
Print_ISBN :
1-4244-0842-3
Electronic_ISBN :
1-4244-0842-3
Type :
conf
DOI :
10.1109/SENSOR.2007.4300680
Filename :
4300680
Link To Document :
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