DocumentCode :
3382418
Title :
Comparison of high efficiency solar cells on large area n-type and p-type silicon wafers with screen-printed Aluminum-alloyed rear junction
Author :
Saynova, D.S. ; Mihailetchi, V.D. ; Geerligs, L.J. ; Weeber, A.W.
Author_Institution :
ECN Solar Energy, PO Box 1, 1755 ZG Petten, The Netherlands
fYear :
2008
fDate :
11-16 May 2008
Firstpage :
1
Lastpage :
5
Abstract :
Low-cost, high-efficiency, and large area n-type silicon cells can be processed based on the screen printed Aluminum-alloyed rear junction concept. This process uses fabrication techniques which are very close to the current industry-standard screen printed mc-Si cell process. We compare, by experimental tests and modeling, the differences of using n-type wafers and p-type wafers with this process. An independently confirmed record-high efficiency of 17.4% is achieved on n-type floatzone (FZ) silicon wafers (area 140 cm2). On p-type FZ wafers, with the same process 17.6% is obtained, and 16.8% on p-type Cz wafers. Model calculations allow us to identify the potential for further enhancement of the n-type cell efficiency to slightly above 18.0% by improving front surface passivation. We also discuss experimental characteristics of cells produced by this process from n-type multicrystalline wafers.
Keywords :
Aluminum; Artificial intelligence; Belts; Coatings; Etching; Metals industry; Photovoltaic cells; Semiconductor device modeling; Silicon; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 2008. PVSC '08. 33rd IEEE
Conference_Location :
San Diego, CA, USA
ISSN :
0160-8371
Print_ISBN :
978-1-4244-1640-0
Electronic_ISBN :
0160-8371
Type :
conf
DOI :
10.1109/PVSC.2008.4922760
Filename :
4922760
Link To Document :
بازگشت