• DocumentCode
    3382803
  • Title

    A robust FIR filter with in situ error detection

  • Author

    Whatmough, Paul N. ; Darwazeh, Izzat ; Bull, David M. ; Das, Shidhartha ; Kershaw, Danny

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Univ. Coll. London, London, UK
  • fYear
    2010
  • fDate
    May 30 2010-June 2 2010
  • Firstpage
    4185
  • Lastpage
    4188
  • Abstract
    We propose a novel FIR filter architecture that mitigates sub-critical timing violations as they occur in the pipeline structure by momentarily bypassing affected coefficients. Timing violations are detected using known in situ circuit-level techniques based on late transition detection at timing end points. The approach enables operation with a small but non-zero logical error rate, such that process, voltage and temperature margins can be eliminated without compromising stop-band attenuation. The proposed architecture is implemented in a 90nm CMOS process technology using a typical commercial standard cell implementation flow and verified using full model SPICE simulations. The filter operates at a maximum clock frequency of 420 MHz at 1 V, with an estimated area and power overhead of 26% and 24% respectively compared to a conventional implementation. At the typical process and temperature corner, the proposed architecture can be scaled in voltage down to the point of first failure at 730 mV, thereby achieving a 53% power saving, with no detectable degradation in stop-band attenuation characteristics.
  • Keywords
    CMOS digital integrated circuits; FIR filters; band-stop filters; pipeline processing; semiconductor device reliability; CMOS process technology; SPICE simulation; in situ error detection; non zero logical error rate; pipeline structure; robust FIR filter; size 90 nm; standard cell; stop band attenuation; timing violation; voltage 1 V; Attenuation; Circuits; Error analysis; Finite impulse response filter; Frequency estimation; Pipelines; Robustness; Temperature; Timing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (ISCAS), Proceedings of 2010 IEEE International Symposium on
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4244-5308-5
  • Electronic_ISBN
    978-1-4244-5309-2
  • Type

    conf

  • DOI
    10.1109/ISCAS.2010.5537581
  • Filename
    5537581