DocumentCode
3382840
Title
A simulation study of vertical tunnel field effect transistors
Author
Han, Zhong-Fang ; Ru, Guo-Ping ; Ruan, Gang
Author_Institution
Dept. of Microelectron., Fudan Univ., Shanghai, China
fYear
2011
fDate
25-28 Oct. 2011
Firstpage
665
Lastpage
668
Abstract
We report a simulation study of the characteristics of a new tunnel field effect transistor (TFET), i.e., vertical TFET (VTFET). The new VTFET has a different working principle compared with the traditional lateral TFET (LTFET), which most of the recent studies are focused on. Although both type TFETs are based on band to band tunneling, the tunneling occurs perpendicular to the oxide-Si interface in the VTFET whereas it occurs parallel in LTFET. The VTFET has many advantages compared with the LTFET, such as a steeper subthreshold slope as the gate voltage control the tunneling directly. The steep subthreshold slope results in low OFF current and capability for low power operation.
Keywords
field effect transistors; low-power electronics; semiconductor device models; tunnel transistors; tunnelling; voltage control; LTFET; VTFET; band to band tunneling; gate voltage control; lateral TFET; low OFF current; low power operation; oxide-silicon interface; simulation study; steeper subthreshold slope; vertical TFET; vertical tunnel field effect transistors; working principle; Immune system; Logic gates; MOSFET circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
ASIC (ASICON), 2011 IEEE 9th International Conference on
Conference_Location
Xiamen
ISSN
2162-7541
Print_ISBN
978-1-61284-192-2
Electronic_ISBN
2162-7541
Type
conf
DOI
10.1109/ASICON.2011.6157293
Filename
6157293
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