• DocumentCode
    3382840
  • Title

    A simulation study of vertical tunnel field effect transistors

  • Author

    Han, Zhong-Fang ; Ru, Guo-Ping ; Ruan, Gang

  • Author_Institution
    Dept. of Microelectron., Fudan Univ., Shanghai, China
  • fYear
    2011
  • fDate
    25-28 Oct. 2011
  • Firstpage
    665
  • Lastpage
    668
  • Abstract
    We report a simulation study of the characteristics of a new tunnel field effect transistor (TFET), i.e., vertical TFET (VTFET). The new VTFET has a different working principle compared with the traditional lateral TFET (LTFET), which most of the recent studies are focused on. Although both type TFETs are based on band to band tunneling, the tunneling occurs perpendicular to the oxide-Si interface in the VTFET whereas it occurs parallel in LTFET. The VTFET has many advantages compared with the LTFET, such as a steeper subthreshold slope as the gate voltage control the tunneling directly. The steep subthreshold slope results in low OFF current and capability for low power operation.
  • Keywords
    field effect transistors; low-power electronics; semiconductor device models; tunnel transistors; tunnelling; voltage control; LTFET; VTFET; band to band tunneling; gate voltage control; lateral TFET; low OFF current; low power operation; oxide-silicon interface; simulation study; steeper subthreshold slope; vertical TFET; vertical tunnel field effect transistors; working principle; Immune system; Logic gates; MOSFET circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ASIC (ASICON), 2011 IEEE 9th International Conference on
  • Conference_Location
    Xiamen
  • ISSN
    2162-7541
  • Print_ISBN
    978-1-61284-192-2
  • Electronic_ISBN
    2162-7541
  • Type

    conf

  • DOI
    10.1109/ASICON.2011.6157293
  • Filename
    6157293