• DocumentCode
    3382956
  • Title

    Detailed analysis of annealing silver front side contacts on silicon solar cells

  • Author

    Kontermann, S. ; Grohe, A. ; Preu, R.

  • Author_Institution
    Fraunhofer Institute for Solar Energy Systems (ISE), Heidenhofstrasse 2, 79110 Freiburg, Germany
  • fYear
    2008
  • fDate
    11-16 May 2008
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    New concepts for high efficient solar cells require a post processing annealing step for passivation quality improvement. For cutting costs, thick film metallization is used for the front side. In this paper annealing steps of different duration and temperature are applied to standard industrial silicon solar cells to probe the sensitivity for such a front side metallization towards annealing. This paper focuses on five minute annealing under nitrogen atmosphere and determines favourable annealing temperatures and metallization pastes. In our investigations I–V curve measurements showed that from a certain threshold onwards, an increasing thermal budget decreases cell´s performance. Series and contact resistance measurements were determined to be significantly affected by annealing. Scanning electron microscopy (SEM) revealed that silver crystallites at the silver silicon interface are transformed in shape for annealing at high temperatures which is most probable the microscopic reason for an increased contact resistance.
  • Keywords
    Annealing; Atmospheric measurements; Contact resistance; Electrical resistance measurement; Metallization; Photovoltaic cells; Scanning electron microscopy; Silicon; Silver; Temperature sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2008. PVSC '08. 33rd IEEE
  • Conference_Location
    San Diego, CA, USA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-1640-0
  • Electronic_ISBN
    0160-8371
  • Type

    conf

  • DOI
    10.1109/PVSC.2008.4922788
  • Filename
    4922788