DocumentCode :
3383112
Title :
Comparing high-frequency de-embedding strategies: immittance correction and in-situ calibration
Author :
Gillon, Renaud ; Van de Sype, Wim ; Vanhoenaker, D. ; Martens, Luc
Author_Institution :
Alcatel Microelectronics
fYear :
2000
fDate :
16-16 March 2000
Firstpage :
241
Lastpage :
245
Keywords :
CMOS technology; Calibration; Impedance; Joining processes; Loss measurement; Microelectronics; Parasitic capacitance; Probes; Scattering parameters; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microelectronic Test Structures, 2000. ICMTS 2000. Proceedings of the 2000 International Conference on
Conference_Location :
Monterey, CA, USA
Print_ISBN :
0-7803-6275-7
Type :
conf
DOI :
10.1109/ICMTS.2000.1193989
Filename :
1193989
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3383112
بازگشت