DocumentCode
3383156
Title
Novel concepts for high voltage junction termination techniques using very deep trenches
Author
Dragomirescu, D. ; Charitat, G. ; Morancho, F. ; Rossel, P.
Author_Institution
Lab. d´´Autom. et d´´Anal. des Syst., CNRS, Toulouse, France
Volume
1
fYear
1999
fDate
1999
Firstpage
67
Abstract
Numerous techniques have been used to improve the voltage handling capability of high voltage power devices with the aim to obtain the breakdown of a plane junction. In this work, we present a new high voltage junction termination technique using very deep trenches available from microsystems technologies. This new concept names Trench Termination Technique: T3 increase the device breakdown voltage to almost the ideal value of the plane case and, in the same time, consume a much lower Silicon space than the previous proposed solutions as an example. Two different architectures for 6 kV devices are described, but these techniques are easily scalable to any voltage range (in the field of high voltage devices)
Keywords
power semiconductor devices; semiconductor device breakdown; semiconductor junctions; semiconductor technology; 6 kV; Si; breakdown voltage; high voltage power device; junction termination extension; microsystem technology; trench termination technique; Anodes; Breakdown voltage; Diffusion processes; Doping; Etching; Low voltage; Protection; Silicon; Space charge; Space technology;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Conference, 1999. CAS '99 Proceedings. 1999 International
Conference_Location
Sinaia
Print_ISBN
0-7803-5139-8
Type
conf
DOI
10.1109/SMICND.1999.810432
Filename
810432
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