• DocumentCode
    3383156
  • Title

    Novel concepts for high voltage junction termination techniques using very deep trenches

  • Author

    Dragomirescu, D. ; Charitat, G. ; Morancho, F. ; Rossel, P.

  • Author_Institution
    Lab. d´´Autom. et d´´Anal. des Syst., CNRS, Toulouse, France
  • Volume
    1
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    67
  • Abstract
    Numerous techniques have been used to improve the voltage handling capability of high voltage power devices with the aim to obtain the breakdown of a plane junction. In this work, we present a new high voltage junction termination technique using very deep trenches available from microsystems technologies. This new concept names Trench Termination Technique: T3 increase the device breakdown voltage to almost the ideal value of the plane case and, in the same time, consume a much lower Silicon space than the previous proposed solutions as an example. Two different architectures for 6 kV devices are described, but these techniques are easily scalable to any voltage range (in the field of high voltage devices)
  • Keywords
    power semiconductor devices; semiconductor device breakdown; semiconductor junctions; semiconductor technology; 6 kV; Si; breakdown voltage; high voltage power device; junction termination extension; microsystem technology; trench termination technique; Anodes; Breakdown voltage; Diffusion processes; Doping; Etching; Low voltage; Protection; Silicon; Space charge; Space technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Conference, 1999. CAS '99 Proceedings. 1999 International
  • Conference_Location
    Sinaia
  • Print_ISBN
    0-7803-5139-8
  • Type

    conf

  • DOI
    10.1109/SMICND.1999.810432
  • Filename
    810432